The IC scanner system FLS 103 is particularly suitable to test for PCB and IC. It has a positioning system with 3 or 4 axes to guide the ICR probes and a PCB holder to support the EUT. The measurement is according to norm IEC 61967-3.

The IC scanner uses several ICR probes to measure E- and H-near fields of frequency range from 10MHz to 3GHz. The probes can be moved above the IC surface in all three axes and can be around the z-axis with a resolution of micrometers.

The scanner is controlled via PC with Software ChipScan. The ChipScan software comprises components to operate and control the entire measuring set-up. The mesuring algorithms are carried out in an interactive mode and the results of the measurement are shown in a three-dimensional graphic. The measured data can be exported as excel data.

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The patented EMC-Scanner measures the emission from components, cables, PCB's and products. The system consists of an X-Y-Z robot, a spectrum analyzer with near field probe, a GPIB card for communicating with the spectrum analyzer and a standard PC with custom software.

During measurement the near field probe is moved by the robot to predetermined measuring points above the test object.

The measuring systems enable the designers to measure the intensity and location of radiation source at a component level. The results of such a measurement can be shown as two or three dimensional coloured maps. The measurements can easily be repeated creating objective, comparative measurement results.

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